Research Article
X-ray diffraction study of the strain-stress thickness profiling in GaN⁄(〖Al〗_2 O_3 ) heterostructure
Volume 1 | Issue 1 | July-December 2023
Disclaimer:
This article was originally published by Qassim University and was migrated to Scientific Scholar after the change of Publisher.
This article was originally published by Qassim University and was migrated to Scientific Scholar after the change of Publisher.